TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_52_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-003-00 | FUSED_ID : 6359364768397037616
  IC_TEMP :  -58.55 | VDDM : 1124.25 | AUX_INT :   -6.71 | CsaBias :   77.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05935e-03 / 2
  ADC_P0  : -6.71263e-03 ± 2.20548e-02
  ADC_P1  : 8.44097e-03 ± 5.53171e-04
  ADC_P2  : -5.70901e-06 ± 2.73741e-06
  CSA_Chi2/NDF : 1.56033e-04 / 2
  CSA_P0  : 5.98127e-02 ± 8.33165e-03
  CSA_P1  : 1.02868e-02 ± 6.27729e-04
  CSA_P2  : -4.93525e-05 ± 9.55958e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [32, 50, 84, 93, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 10, 31, 44, 56, 74, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3117', '1.800', '0.1189', '1.800', '0.0925', '7.000', '0.7087', 1, 1, 1, 1, 1725969143.9545553]
VI_after__Init : ['1.201', '0.3114', '1.800', '0.1189', '1.800', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1725969152.2318861]
VI_at__the_End : ['1.201', '0.5083', '1.800', '0.1427', '1.800', '0.1138', '7.000', '0.7085', 1, 1, 1, 1, 1725969212.5912461]