TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_46_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-007-00 | FUSED_ID : 6359364768397037680
  IC_TEMP :  -51.14 | VDDM : 1129.19 | AUX_INT :   -9.02 | CsaBias :   81.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39101e-03 / 2
  ADC_P0  : -9.02457e-03 ± 2.53154e-02
  ADC_P1  : 8.24786e-03 ± 6.19425e-04
  ADC_P2  : -4.99725e-06 ± 3.02165e-06
  CSA_Chi2/NDF : 1.36372e-04 / 2
  CSA_P0  : 5.96970e-02 ± 7.78906e-03
  CSA_P1  : 1.02014e-02 ± 5.86850e-04
  CSA_P2  : -4.81944e-05 ± 8.93703e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 17, 20, 33, 34, 60, 65, 90, 95, 115, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 11, 19, 71, 86, 108, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3730', '1.800', '0.1585', '1.800', '0.0975', '7.000', '0.7078', 1, 1, 1, 1, 1725968763.2230048]
VI_after__Init : ['1.201', '0.3733', '1.800', '0.1585', '1.800', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1725968771.9503856]
VI_at__the_End : ['1.201', '0.5069', '1.800', '0.1421', '1.800', '0.1129', '7.000', '0.7088', 1, 1, 1, 1, 1725968839.227139]