TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_44_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-008-00 | FUSED_ID : 6359364768397037696
  IC_TEMP :  -51.85 | VDDM : 1123.95 | AUX_INT :   -8.74 | CsaBias :   81.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26567e-03 / 2
  ADC_P0  : -8.74211e-03 ± 2.41049e-02
  ADC_P1  : 8.24968e-03 ± 5.82771e-04
  ADC_P2  : -5.53245e-06 ± 2.80096e-06
  CSA_Chi2/NDF : 8.57778e-05 / 2
  CSA_P0  : 6.06178e-02 ± 6.17746e-03
  CSA_P1  : 9.69294e-03 ± 4.65427e-04
  CSA_P2  : -4.18067e-05 ± 7.08790e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [13, 20, 23, 48, 57, 60, 64, 82, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 1, 29, 56, 85, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3463', '1.800', '0.1684', '1.800', '0.0880', '7.000', '0.7077', 1, 1, 1, 1, 1725968665.5305395]
VI_after__Init : ['1.201', '0.3464', '1.800', '0.1683', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1725968674.3878744]
VI_at__the_End : ['1.201', '0.5004', '1.800', '0.1432', '1.800', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1725968742.3305526]