TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_42_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-009-00 | FUSED_ID : 6359364768397037712
  IC_TEMP :  -53.15 | VDDM : 1124.92 | AUX_INT :   -9.71 | CsaBias :   89.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74079e-03 / 2
  ADC_P0  : -9.70971e-03 ± 2.83323e-02
  ADC_P1  : 8.34817e-03 ± 6.93360e-04
  ADC_P2  : -5.52373e-06 ± 3.37906e-06
  CSA_Chi2/NDF : 1.29911e-04 / 2
  CSA_P0  : 6.25373e-02 ± 7.60232e-03
  CSA_P1  : 9.93488e-03 ± 5.72780e-04
  CSA_P2  : -4.50592e-05 ± 8.72276e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [37, 116, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [35, 74, 81, 90, 93, 108, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3019', '1.800', '0.1564', '1.800', '0.0972', '7.000', '0.7076', 1, 1, 1, 1, 1725968569.2669952]
VI_after__Init : ['1.202', '0.3021', '1.800', '0.1565', '1.800', '0.0915', '7.000', '0.7079', 1, 1, 1, 1, 1725968577.3874164]
VI_at__the_End : ['1.201', '0.5055', '1.800', '0.1439', '1.799', '0.1137', '7.000', '0.7084', 1, 1, 1, 1, 1725968637.2167742]