TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_41_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-010-00 | FUSED_ID : 6359364768397037728
  IC_TEMP :  -53.26 | VDDM : 1127.57 | AUX_INT :  -10.29 | CsaBias :   71.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.89644e-03 / 2
  ADC_P0  : -1.02882e-02 ± 2.96208e-02
  ADC_P1  : 8.20052e-03 ± 7.21139e-04
  ADC_P2  : -4.70162e-06 ± 3.51577e-06
  CSA_Chi2/NDF : 1.23777e-04 / 2
  CSA_P0  : 6.02593e-02 ± 7.42067e-03
  CSA_P1  : 9.91082e-03 ± 5.59094e-04
  CSA_P2  : -4.55602e-05 ± 8.51434e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [53, 56, 68, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [29, 61, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2736', '1.800', '0.1605', '1.800', '0.0935', '7.000', '0.7087', 1, 1, 1, 1, 1725968472.421635]
VI_after__Init : ['1.202', '0.2736', '1.800', '0.1605', '1.800', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1725968480.6969757]
VI_at__the_End : ['1.201', '0.4995', '1.800', '0.1432', '1.800', '0.1128', '7.000', '0.7086', 1, 1, 1, 1, 1725968547.6898313]