TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_33_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-015-00 | FUSED_ID : 6359364768397037808
  IC_TEMP :  -51.48 | VDDM : 1118.71 | AUX_INT :   -8.16 | CsaBias :   75.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38068e-03 / 2
  ADC_P0  : -8.15509e-03 ± 2.51582e-02
  ADC_P1  : 8.43856e-03 ± 6.15496e-04
  ADC_P2  : -6.17413e-06 ± 2.98746e-06
  CSA_Chi2/NDF : 8.74301e-05 / 2
  CSA_P0  : 6.17373e-02 ± 6.23667e-03
  CSA_P1  : 9.75128e-03 ± 4.69888e-04
  CSA_P2  : -4.23990e-05 ± 7.15584e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [21, 72, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [1, 11, 49, 53, 58, 64, 91, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3820', '1.800', '0.1407', '1.800', '0.0879', '7.000', '0.7071', 1, 1, 1, 1, 1725967987.2597132]
VI_after__Init : ['1.201', '0.3823', '1.800', '0.1408', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1725967995.5009751]
VI_at__the_End : ['1.201', '0.5045', '1.800', '0.1409', '1.799', '0.1119', '7.000', '0.7079', 1, 1, 1, 1, 1725968063.2516723]