TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_25_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-020-07 | FUSED_ID : 6359364768397037895
  IC_TEMP :  -50.57 | VDDM : 1125.78 | AUX_INT :   -9.02 | CsaBias :   79.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43085e-03 / 2
  ADC_P0  : -9.02431e-03 ± 2.56582e-02
  ADC_P1  : 8.12966e-03 ± 6.13217e-04
  ADC_P2  : -5.21516e-06 ± 2.91601e-06
  CSA_Chi2/NDF : 9.86022e-05 / 2
  CSA_P0  : 6.09895e-02 ± 6.62317e-03
  CSA_P1  : 9.61508e-03 ± 4.99008e-04
  CSA_P2  : -4.16848e-05 ± 7.59930e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [12, 18, 26, 35, 36, 75, 79, 87, 103, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [66, 74, 79, 113, 115, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2707', '1.800', '0.1741', '1.800', '0.0986', '7.000', '0.7071', 1, 1, 1, 1, 1725967502.4479034]
VI_after__Init : ['1.202', '0.2708', '1.800', '0.1739', '1.800', '0.0928', '7.000', '0.7069', 1, 1, 1, 1, 1725967511.2792804]
VI_at__the_End : ['1.201', '0.5002', '1.800', '0.1405', '1.800', '0.1124', '7.000', '0.7077', 1, 1, 1, 1, 1725967570.705639]