TEST_NAME : Wafer
TEST_DATE : 24_09_10-13_23_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-009-021-07 | FUSED_ID : 6359364768397037911
  IC_TEMP :  -55.11 | VDDM : 1125.43 | AUX_INT :   -9.07 | CsaBias :   74.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.16728e-04 / 2
  CSA_P0  : 6.13082e-02 ± 7.20626e-03
  CSA_P1  : 1.00063e-02 ± 5.42940e-04
  CSA_P2  : -4.60808e-05 ± 8.26833e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [28, 34, 42, 50, 56, 58, 71, 82, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 24, 44, 57, 68, 85, 108, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4783', '1.800', '0.1593', '1.800', '0.1040', '7.000', '0.7070', 1, 1, 1, 1, 1725967405.4854026]
VI_after__Init : ['1.201', '0.4785', '1.800', '0.1596', '1.800', '0.0982', '7.000', '0.7070', 1, 1, 1, 1, 1725967414.289776]
VI_at__the_End : ['1.201', '0.5076', '1.800', '0.1415', '1.800', '0.1135', '7.000', '0.7077', 1, 1, 1, 1, 1725967482.7203739]