TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_03_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-007-14 | FUSED_ID : 6359364768397041790
  IC_TEMP :  -47.36 | VDDM : 1125.98 | AUX_INT :  -25.18 | CsaBias :   75.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25310e-03 / 2
  ADC_P0  : -2.51835e-02 ± 2.48677e-02
  ADC_P1  : 8.42024e-03 ± 6.01081e-04
  ADC_P2  : -5.85809e-06 ± 2.87708e-06
  CSA_Chi2/NDF : 7.39073e-05 / 2
  CSA_P0  : 6.03914e-02 ± 5.73411e-03
  CSA_P1  : 9.35500e-03 ± 4.32024e-04
  CSA_P2  : -3.74025e-05 ± 6.57921e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [57, 83, 104, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 70, 88, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2890', '1.800', '0.1776', '1.800', '0.0891', '6.999', '0.7080', 1, 1, 1, 1, 1725969820.9985104]
VI_after__Init : ['1.201', '0.2891', '1.800', '0.1777', '1.800', '0.0833', '7.000', '0.7079', 1, 1, 1, 1, 1725969829.8439584]
VI_at__the_End : ['1.201', '0.4971', '1.800', '0.1394', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1725969895.7395632]