TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_05_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-008-14 | FUSED_ID : 6359364768397041806
  IC_TEMP :  -52.34 | VDDM : 1133.73 | AUX_INT :  -33.96 | CsaBias :   75.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62068e-03 / 2
  ADC_P0  : -3.39582e-02 ± 2.88321e-02
  ADC_P1  : 8.50662e-03 ± 6.92169e-04
  ADC_P2  : -6.27825e-06 ± 3.27659e-06
  CSA_Chi2/NDF : 1.02053e-04 / 2
  CSA_P0  : 5.83554e-02 ± 6.73807e-03
  CSA_P1  : 9.91840e-03 ± 5.07665e-04
  CSA_P2  : -4.47111e-05 ± 7.73113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 21, 63, 77, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [27, 47, 60, 79, 90, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3416', '1.800', '0.1648', '1.800', '0.0952', '7.000', '0.7084', 1, 1, 1, 1, 1725969918.6729696]
VI_after__Init : ['1.202', '0.3414', '1.800', '0.1648', '1.800', '0.0897', '7.000', '0.7079', 1, 1, 1, 1, 1725969926.9815063]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1387', '1.800', '0.1135', '7.000', '0.7086', 1, 1, 1, 1, 1725969988.1913395]