TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_11_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-012-14 | FUSED_ID : 6359364768397041870
  IC_TEMP :  -53.37 | VDDM : 1132.33 | AUX_INT :   -7.26 | CsaBias :   83.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.71510e-04 / 2
  ADC_P0  : -7.26013e-03 ± 1.99577e-02
  ADC_P1  : 8.29282e-03 ± 4.84959e-04
  ADC_P2  : -5.79806e-06 ± 2.33237e-06
  CSA_Chi2/NDF : 9.95907e-05 / 2
  CSA_P0  : 6.26687e-02 ± 6.65628e-03
  CSA_P1  : 1.00393e-02 ± 5.01503e-04
  CSA_P2  : -4.64439e-05 ± 7.63730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [76, 87, 110, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 16, 19, 59, 64, 99, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2678', '1.800', '0.1377', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1725970304.9999154]
VI_after__Init : ['1.201', '0.2677', '1.800', '0.1377', '1.800', '0.0774', '7.000', '0.7078', 1, 1, 1, 1, 1725970313.9203408]
VI_at__the_End : ['1.201', '0.5074', '1.800', '0.1412', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1725970373.1800418]