TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_21_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-018-09 | FUSED_ID : 6359364768397041961
  IC_TEMP :  -50.83 | VDDM : 1126.18 | AUX_INT :   -5.15 | CsaBias :   84.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.05843e-04 / 2
  ADC_P0  : -5.14561e-03 ± 1.51721e-02
  ADC_P1  : 8.17530e-03 ± 3.63907e-04
  ADC_P2  : -5.91797e-06 ± 1.71561e-06
  CSA_Chi2/NDF : 7.80061e-05 / 2
  CSA_P0  : 5.97492e-02 ± 5.89097e-03
  CSA_P1  : 9.43265e-03 ± 4.43842e-04
  CSA_P2  : -3.84003e-05 ± 6.75918e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [17, 22, 28, 31, 36, 47, 59, 80, 106, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [19, 32, 73, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3875', '1.800', '0.1520', '1.800', '0.0964', '7.000', '0.7074', 1, 1, 1, 1, 1725970885.8944442]
VI_after__Init : ['1.202', '0.3874', '1.800', '0.1520', '1.799', '0.0907', '7.000', '0.7076', 1, 1, 1, 1, 1725970894.0358844]
VI_at__the_End : ['1.202', '0.4986', '1.800', '0.1398', '1.800', '0.1114', '7.000', '0.7081', 1, 1, 1, 1, 1725970956.9911044]