TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_23_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-019-09 | FUSED_ID : 6359364768397041977
  IC_TEMP :  -56.19 | VDDM : 1125.33 | AUX_INT :   -8.09 | CsaBias :   76.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10798e-03 / 2
  ADC_P0  : -8.08669e-03 ± 2.25276e-02
  ADC_P1  : 8.52683e-03 ± 5.60736e-04
  ADC_P2  : -6.17439e-06 ± 2.76456e-06
  CSA_Chi2/NDF : 1.21891e-04 / 2
  CSA_P0  : 6.23191e-02 ± 7.36390e-03
  CSA_P1  : 1.02596e-02 ± 5.54816e-04
  CSA_P2  : -4.98569e-05 ± 8.44920e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 36, 41, 99, 112, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 23, 37, 48, 53, 59, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4139', '1.800', '0.1937', '1.800', '0.0989', '7.000', '0.7074', 1, 1, 1, 1, 1725970982.7712479]
VI_after__Init : ['1.201', '0.4141', '1.800', '0.1933', '1.800', '0.0933', '7.000', '0.7075', 1, 1, 1, 1, 1725970990.8986466]
VI_at__the_End : ['1.201', '0.5069', '1.800', '0.1423', '1.800', '0.1138', '7.000', '0.7081', 1, 1, 1, 1, 1725971055.5298238]