TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_31_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-024-09 | FUSED_ID : 6359364768397042057
  IC_TEMP :  -57.03 | VDDM : 1132.67 | AUX_INT :   -7.37 | CsaBias :   50.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.80520e-04 / 2
  ADC_P0  : -7.36884e-03 ± 2.00606e-02
  ADC_P1  : 8.29787e-03 ± 4.87460e-04
  ADC_P2  : -5.81164e-06 ± 2.34439e-06
  CSA_Chi2/NDF : 1.40662e-04 / 2
  CSA_P0  : 5.93561e-02 ± 7.91064e-03
  CSA_P1  : 9.97682e-03 ± 5.96009e-04
  CSA_P2  : -4.58619e-05 ± 9.07652e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 43, 72, 94, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [38, 78, 94, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5280', '1.800', '0.1546', '1.800', '0.0993', '7.000', '0.7073', 1, 1, 1, 1, 1725971467.0691042]
VI_after__Init : ['1.201', '0.5225', '1.800', '0.1544', '1.800', '0.0935', '7.000', '0.7069', 1, 1, 1, 1, 1725971475.242511]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1417', '1.799', '0.1116', '7.000', '0.7077', 1, 1, 1, 1, 1725971539.059675]