TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_32_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-010-025-09 | FUSED_ID : 6359364768397042073
  IC_TEMP :  -46.91 | VDDM : 1125.87 | AUX_INT :   -9.56 | CsaBias :   83.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.98302e-03 / 2
  ADC_P0  : -9.55675e-03 ± 3.03207e-02
  ADC_P1  : 7.76823e-03 ± 7.04088e-04
  ADC_P2  : -4.19887e-06 ± 3.25911e-06
  CSA_Chi2/NDF : 1.10905e-04 / 2
  CSA_P0  : 5.87193e-02 ± 7.02421e-03
  CSA_P1  : 9.77516e-03 ± 5.29223e-04
  CSA_P2  : -4.27443e-05 ± 8.05944e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 7, 19, 53, 58, 88, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 40, 88, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3894', '1.800', '0.1265', '1.800', '0.0926', '7.000', '0.7069', 1, 1, 1, 1, 1725971563.470795]
VI_after__Init : ['1.201', '0.3896', '1.800', '0.1265', '1.800', '0.0873', '7.000', '0.7070', 1, 1, 1, 1, 1725971572.2871346]
VI_at__the_End : ['1.201', '0.5037', '1.800', '0.1368', '1.802', '0.1090', '7.000', '0.7079', 1, 1, 1, 1, 1725971634.219528]