TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_11_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-011-006-03 | FUSED_ID : 6359364768397045859
  IC_TEMP :  -64.41 | VDDM : 1118.72 | AUX_INT :   -9.90 | CsaBias :   73.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62072e-03 / 2
  ADC_P0  : -9.90425e-03 ± 2.72688e-02
  ADC_P1  : 8.37829e-03 ± 6.55919e-04
  ADC_P2  : -6.27069e-06 ± 3.13502e-06
  CSA_Chi2/NDF : 1.53767e-04 / 2
  CSA_P0  : 5.88759e-02 ± 8.27093e-03
  CSA_P1  : 1.00796e-02 ± 6.23155e-04
  CSA_P2  : -5.28439e-05 ± 9.48991e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 25, 62, 66, 72, 86, 104, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 10, 40, 42]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3981', '1.800', '0.1640', '1.799', '0.0957', '7.000', '0.7080', 1, 1, 1, 1, 1725973879.510786]
VI_after__Init : ['1.201', '0.3964', '1.800', '0.1639', '1.800', '0.0901', '7.000', '0.7081', 1, 1, 1, 1, 1725973888.3090444]
VI_at__the_End : ['1.201', '0.4791', '1.800', '0.1364', '1.800', '0.1147', '7.000', '0.7086', 1, 1, 1, 1, 1725973955.2803607]