TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_06_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-011-009-03 | FUSED_ID : 6359364768397045907
  IC_TEMP :  -49.77 | VDDM : 1120.50 | AUX_INT :   -7.45 | CsaBias :   78.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13096e-03 / 2
  ADC_P0  : -7.44767e-03 ± 2.27902e-02
  ADC_P1  : 7.89327e-03 ± 5.31661e-04
  ADC_P2  : -5.02681e-06 ± 2.45302e-06
  CSA_Chi2/NDF : 1.00553e-04 / 2
  CSA_P0  : 5.80043e-02 ± 6.68835e-03
  CSA_P1  : 9.88555e-03 ± 5.03919e-04
  CSA_P2  : -4.49125e-05 ± 7.67409e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [59]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 31, 63, 94, 106, 109, 113, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1562', '1.800', '0.1701', '1.800', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1725973588.5086992]
VI_after__Init : ['1.201', '0.1562', '1.800', '0.1699', '1.800', '0.0897', '7.000', '0.7080', 1, 1, 1, 1, 1725973597.4110441]
VI_at__the_End : ['1.201', '0.4990', '1.800', '0.1380', '1.800', '0.1212', '7.000', '0.7084', 1, 1, 1, 1, 1725973657.7713776]