TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_58_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-011-014-03 | FUSED_ID : 6359364768397045987
  IC_TEMP :  -55.51 | VDDM : 1121.84 | AUX_INT :   -6.98 | CsaBias :   75.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85288e-04 / 2
  ADC_P0  : -6.97606e-03 ± 2.12688e-02
  ADC_P1  : 8.27656e-03 ± 5.24193e-04
  ADC_P2  : -5.30418e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 8.59579e-05 / 2
  CSA_P0  : 5.98235e-02 ± 6.18394e-03
  CSA_P1  : 9.51972e-03 ± 4.65915e-04
  CSA_P2  : -4.28112e-05 ± 7.09534e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [18, 19, 51, 60, 67, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [47, 63, 97, 116, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1383', '1.800', '0.1545', '1.800', '0.0817', '6.999', '0.7085', 1, 1, 1, 1, 1725973111.9970725]
VI_after__Init : ['1.201', '0.1383', '1.800', '0.1547', '1.800', '0.0747', '7.000', '0.7079', 1, 1, 1, 1, 1725973120.80252]
VI_at__the_End : ['1.202', '0.4833', '1.800', '0.1398', '1.800', '0.1136', '7.000', '0.7085', 1, 1, 1, 1, 1725973188.0392766]