TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_55_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-011-016-04 | FUSED_ID : 6359364768397046020
  IC_TEMP :  -54.53 | VDDM : 1134.82 | AUX_INT :   -7.82 | CsaBias :   83.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23037e-03 / 2
  ADC_P0  : -7.81694e-03 ± 2.37853e-02
  ADC_P1  : 8.35477e-03 ± 5.88223e-04
  ADC_P2  : -5.50937e-06 ± 2.88187e-06
  CSA_Chi2/NDF : 1.10873e-04 / 2
  CSA_P0  : 6.03803e-02 ± 7.02319e-03
  CSA_P1  : 1.01445e-02 ± 5.29147e-04
  CSA_P2  : -4.76867e-05 ± 8.05828e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 28, 63, 72, 76, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 14, 22, 32, 56, 98, 99, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1501', '1.800', '0.1380', '1.800', '0.0828', '7.000', '0.7080', 1, 1, 1, 1, 1725972919.624764]
VI_after__Init : ['1.202', '0.1500', '1.800', '0.1379', '1.800', '0.0771', '7.000', '0.7077', 1, 1, 1, 1, 1725972927.6472287]
VI_at__the_End : ['1.201', '0.5053', '1.800', '0.1415', '1.800', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1725972994.1771133]