TEST_NAME : Wafer
TEST_DATE : 24_09_10-14_52_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-011-018-04 | FUSED_ID : 6359364768397046052
  IC_TEMP :  -54.96 | VDDM : 1131.65 | AUX_INT :   -8.96 | CsaBias :   74.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 1.16208e-04 / 2
  CSA_P0  : 5.89009e-02 ± 7.19019e-03
  CSA_P1  : 1.01283e-02 ± 5.41729e-04
  CSA_P2  : -4.84709e-05 ± 8.24989e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [40, 46, 58, 65, 71, 85, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [37, 48, 70, 88, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3267', '1.800', '0.1697', '1.800', '0.0950', '7.000', '0.7086', 1, 1, 1, 1, 1725972726.2287898]
VI_after__Init : ['1.201', '0.3267', '1.800', '0.1698', '1.800', '0.0872', '7.000', '0.7077', 1, 1, 1, 1, 1725972734.242074]
VI_at__the_End : ['1.201', '0.5026', '1.800', '0.1387', '1.800', '0.1119', '7.000', '0.7085', 1, 1, 1, 1, 1725972798.2831655]