TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_21_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-003-11 | FUSED_ID : 6359364768397049915
  IC_TEMP :  -53.85 | VDDM : 1111.07 | AUX_INT :   -7.70 | CsaBias :   83.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28218e-03 / 2
  ADC_P0  : -7.69620e-03 ± 2.42736e-02
  ADC_P1  : 8.37044e-03 ± 5.98341e-04
  ADC_P2  : -5.78499e-06 ± 2.91500e-06
  CSA_Chi2/NDF : 1.07090e-04 / 2
  CSA_P0  : 5.82561e-02 ± 6.90234e-03
  CSA_P1  : 9.65234e-03 ± 5.20041e-04
  CSA_P2  : -4.00903e-05 ± 7.91961e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 19, 28, 33, 69, 81, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [35, 36, 44, 74, 99, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4849', '1.800', '0.1638', '1.800', '0.0917', '7.000', '0.7081', 1, 1, 1, 1, 1725974461.109791]
VI_after__Init : ['1.201', '0.4854', '1.800', '0.1639', '1.800', '0.0860', '7.000', '0.7080', 1, 1, 1, 1, 1725974469.217298]
VI_at__the_End : ['1.201', '0.5037', '1.800', '0.1411', '1.800', '0.1122', '7.000', '0.7086', 1, 1, 1, 1, 1725974536.150913]