TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_27_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-007-11 | FUSED_ID : 6359364768397049979
  IC_TEMP :  -49.59 | VDDM : 1125.83 | AUX_INT :   -9.93 | CsaBias :   94.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70132e-03 / 2
  ADC_P0  : -9.93475e-03 ± 2.79885e-02
  ADC_P1  : 8.06477e-03 ± 6.57911e-04
  ADC_P2  : -5.29043e-06 ± 3.08175e-06
  CSA_Chi2/NDF : 7.81562e-05 / 2
  CSA_P0  : 6.05193e-02 ± 5.89663e-03
  CSA_P1  : 9.67641e-03 ± 4.44269e-04
  CSA_P2  : -4.07448e-05 ± 6.76569e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [12, 27, 46, 50, 59, 85, 109, 113, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [14, 16, 17, 28, 43, 58, 70, 74, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2884', '1.800', '0.1642', '1.800', '0.0889', '7.000', '0.7077', 1, 1, 1, 1, 1725974847.2833283]
VI_after__Init : ['1.201', '0.2886', '1.800', '0.1642', '1.801', '0.0831', '7.005', '0.7077', 1, 1, 1, 1, 1725974855.2796946]
VI_at__the_End : ['1.201', '0.5071', '1.800', '0.1397', '1.802', '0.1107', '7.000', '0.7082', 1, 1, 1, 1, 1725974922.718401]