TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_29_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-008-11 | FUSED_ID : 6359364768397049995
  IC_TEMP :  -50.60 | VDDM : 1129.43 | AUX_INT :   -9.34 | CsaBias :   83.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50562e-03 / 2
  ADC_P0  : -9.34022e-03 ± 2.63198e-02
  ADC_P1  : 8.46181e-03 ± 6.51751e-04
  ADC_P2  : -5.79999e-06 ± 3.21119e-06
  CSA_Chi2/NDF : 9.98715e-05 / 2
  CSA_P0  : 6.17234e-02 ± 6.66566e-03
  CSA_P1  : 9.67237e-03 ± 5.02209e-04
  CSA_P2  : -4.11392e-05 ± 7.64805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [14, 20, 32, 34, 47, 64, 70, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 37, 40, 69, 118, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1638', '1.800', '0.1944', '1.800', '0.0875', '7.000', '0.7076', 1, 1, 1, 1, 1725974944.903672]
VI_after__Init : ['1.202', '0.1639', '1.800', '0.1943', '1.800', '0.0817', '7.000', '0.7075', 1, 1, 1, 1, 1725974952.9659965]
VI_at__the_End : ['1.201', '0.5036', '1.800', '0.1426', '1.800', '0.1116', '7.000', '0.7081', 1, 1, 1, 1, 1725975020.3646607]