TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_35_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-012-11 | FUSED_ID : 6359364768397050059
  IC_TEMP :  -54.88 | VDDM : 1140.17 | AUX_INT :   -8.50 | CsaBias :   83.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.16811e-04 / 2
  CSA_P0  : 5.92004e-02 ± 7.20882e-03
  CSA_P1  : 1.00126e-02 ± 5.43133e-04
  CSA_P2  : -4.54783e-05 ± 8.27127e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 63, 90, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [19, 22, 26, 38, 42, 57, 77, 84, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2232', '1.800', '0.1554', '1.800', '0.0894', '7.000', '0.7071', 1, 1, 1, 1, 1725975332.337417]
VI_after__Init : ['1.202', '0.2233', '1.800', '0.1553', '1.800', '0.0837', '7.000', '0.7072', 1, 1, 1, 1, 1725975340.2517946]
VI_at__the_End : ['1.201', '0.5057', '1.800', '0.1411', '1.800', '0.1118', '7.000', '0.7076', 1, 1, 1, 1, 1725975401.384035]