TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_38_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-014-11 | FUSED_ID : 6359364768397050091
  IC_TEMP :  -47.27 | VDDM : 1126.56 | AUX_INT :   -9.25 | CsaBias :   85.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43243e-03 / 2
  ADC_P0  : -9.25429e-03 ± 2.56634e-02
  ADC_P1  : 7.99781e-03 ± 6.01273e-04
  ADC_P2  : -5.12098e-06 ± 2.80394e-06
  CSA_Chi2/NDF : 5.49887e-05 / 2
  CSA_P0  : 5.94634e-02 ± 4.94606e-03
  CSA_P1  : 9.39443e-03 ± 3.72650e-04
  CSA_P2  : -3.83994e-05 ± 5.67501e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 26, 35, 81, 96, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [12, 30, 44, 55, 86, 102, 103, 106, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3274', '1.800', '0.1107', '1.800', '0.0882', '7.000', '0.7071', 1, 1, 1, 1, 1725975526.2863314]
VI_after__Init : ['1.201', '0.3275', '1.800', '0.1107', '1.800', '0.0825', '7.000', '0.7072', 1, 1, 1, 1, 1725975534.9775772]
VI_at__the_End : ['1.201', '0.4973', '1.800', '0.1377', '1.801', '0.1100', '7.000', '0.7079', 1, 1, 1, 1, 1725975594.386018]