TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_42_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-016-12 | FUSED_ID : 6359364768397050124
  IC_TEMP :  -57.38 | VDDM : 1130.10 | AUX_INT :   -7.54 | CsaBias :   78.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33335e-04 / 2
  ADC_P0  : -7.54099e-03 ± 2.06506e-02
  ADC_P1  : 8.64389e-03 ± 5.20227e-04
  ADC_P2  : -6.46705e-06 ± 2.59341e-06
  CSA_Chi2/NDF : 8.88848e-05 / 2
  CSA_P0  : 6.10224e-02 ± 6.28834e-03
  CSA_P1  : 9.49143e-03 ± 4.73781e-04
  CSA_P2  : -4.12617e-05 ± 7.21513e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [57, 85, 115, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 23, 58, 59, 65, 67, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3347', '1.800', '0.1307', '1.800', '0.0875', '7.000', '0.7079', 1, 1, 1, 1, 1725975720.3862832]
VI_after__Init : ['1.201', '0.3334', '1.800', '0.1305', '1.800', '0.0812', '7.000', '0.7072', 1, 1, 1, 1, 1725975728.372626]
VI_at__the_End : ['1.201', '0.4924', '1.800', '0.1391', '1.800', '0.1137', '7.000', '0.7077', 1, 1, 1, 1, 1725975791.455796]