TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_45_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-018-12 | FUSED_ID : 6359364768397050156
  IC_TEMP :  -49.13 | VDDM : 1130.20 | AUX_INT :   -6.76 | CsaBias :   75.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.52329e-04 / 2
  ADC_P0  : -6.76033e-03 ± 1.97457e-02
  ADC_P1  : 8.27272e-03 ± 4.80842e-04
  ADC_P2  : -5.77846e-06 ± 2.31043e-06
  CSA_Chi2/NDF : 9.63055e-05 / 2
  CSA_P0  : 5.86226e-02 ± 6.54558e-03
  CSA_P1  : 9.96395e-03 ± 4.93162e-04
  CSA_P2  : -4.47215e-05 ± 7.51027e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [36, 57, 60, 83, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 27, 74, 86, 115, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3770', '1.800', '0.1551', '1.800', '0.0976', '7.000', '0.7080', 1, 1, 1, 1, 1725975914.0293477]
VI_after__Init : ['1.201', '0.3770', '1.800', '0.1551', '1.800', '0.0897', '7.000', '0.7073', 1, 1, 1, 1, 1725975922.1798275]
VI_at__the_End : ['1.201', '0.5055', '1.800', '0.1421', '1.800', '0.1107', '7.000', '0.7080', 1, 1, 1, 1, 1725975981.1213179]