TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_48_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-020-12 | FUSED_ID : 6359364768397050188
  IC_TEMP :  -51.67 | VDDM : 1134.13 | AUX_INT :   -5.75 | CsaBias :   85.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.98187e-04 / 2
  ADC_P0  : -5.74769e-03 ± 2.02859e-02
  ADC_P1  : 8.37753e-03 ± 5.05361e-04
  ADC_P2  : -5.77841e-06 ± 2.47502e-06
  CSA_Chi2/NDF : 7.22329e-05 / 2
  CSA_P0  : 5.92890e-02 ± 5.66878e-03
  CSA_P1  : 9.50253e-03 ± 4.27102e-04
  CSA_P2  : -3.80043e-05 ± 6.50426e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 14, 48, 59, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 21, 31, 72, 89, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5179', '1.800', '0.1596', '1.800', '0.0959', '7.000', '0.7072', 1, 1, 1, 1, 1725976108.6397452]
VI_after__Init : ['1.201', '0.5184', '1.800', '0.1596', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1725976116.6981921]
VI_at__the_End : ['1.201', '0.5049', '1.800', '0.1398', '1.799', '0.1098', '7.000', '0.7081', 1, 1, 1, 1, 1725976184.4221117]