TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_50_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-021-12 | FUSED_ID : 6359364768397050204
  IC_TEMP :  -55.32 | VDDM : 1113.52 | AUX_INT :   -6.44 | CsaBias :   92.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.86178e-04 / 2
  ADC_P0  : -6.44048e-03 ± 2.01278e-02
  ADC_P1  : 8.27453e-03 ± 4.88580e-04
  ADC_P2  : -5.96297e-06 ± 2.33473e-06
  CSA_Chi2/NDF : 9.24645e-05 / 2
  CSA_P0  : 5.91463e-02 ± 6.41372e-03
  CSA_P1  : 9.24738e-03 ± 4.83227e-04
  CSA_P2  : -3.75300e-05 ± 7.35898e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [27, 30, 44, 67, 77, 78, 82, 98, 119, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 2, 22, 24, 25, 34, 65, 87, 90, 105, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1069', '1.800', '0.1674', '1.800', '0.0809', '7.000', '0.7076', 1, 1, 1, 1, 1725976204.5785902]
VI_after__Init : ['1.201', '0.1069', '1.800', '0.1675', '1.800', '0.0754', '7.000', '0.7077', 1, 1, 1, 1, 1725976213.4329772]
VI_at__the_End : ['1.202', '0.4899', '1.800', '0.1365', '1.800', '0.1131', '7.000', '0.7081', 1, 1, 1, 1, 1725976280.3787751]