TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_51_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-022-12 | FUSED_ID : 6359364768397050220
  IC_TEMP :  -51.18 | VDDM : 1127.03 | AUX_INT :   -6.57 | CsaBias :   90.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.81332e-04 / 2
  ADC_P0  : -6.56887e-03 ± 2.12281e-02
  ADC_P1  : 8.10940e-03 ± 5.13643e-04
  ADC_P2  : -5.13444e-06 ± 2.45278e-06
  CSA_Chi2/NDF : 8.37851e-05 / 2
  CSA_P0  : 6.06652e-02 ± 6.10528e-03
  CSA_P1  : 9.51022e-03 ± 4.59989e-04
  CSA_P2  : -3.88257e-05 ± 7.00509e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [11, 18, 52, 57, 75, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [5, 22, 25, 92, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2586', '1.800', '0.1697', '1.800', '0.0863', '7.000', '0.7083', 1, 1, 1, 1, 1725976302.4221802]
VI_after__Init : ['1.202', '0.2586', '1.800', '0.1697', '1.800', '0.0789', '7.000', '0.7076', 1, 1, 1, 1, 1725976310.7484894]
VI_at__the_End : ['1.201', '0.5003', '1.800', '0.1394', '1.800', '0.1108', '7.000', '0.7082', 1, 1, 1, 1, 1725976375.5754588]