TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_53_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-023-12 | FUSED_ID : 6359364768397050236
  IC_TEMP :  -52.49 | VDDM : 1126.26 | AUX_INT :   -8.36 | CsaBias :   81.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10649e-03 / 2
  ADC_P0  : -8.36201e-03 ± 2.24978e-02
  ADC_P1  : 8.23059e-03 ± 5.37519e-04
  ADC_P2  : -5.87400e-06 ± 2.54600e-06
  CSA_Chi2/NDF : 8.14415e-05 / 2
  CSA_P0  : 6.11652e-02 ± 6.01929e-03
  CSA_P1  : 9.70663e-03 ± 4.53510e-04
  CSA_P2  : -4.08420e-05 ± 6.90642e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [3, 7, 27, 46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [18, 28, 38, 87, 110, 111, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3417', '1.800', '0.1596', '1.800', '0.0877', '7.000', '0.7075', 1, 1, 1, 1, 1725976400.0287948]
VI_after__Init : ['1.201', '0.3417', '1.800', '0.1596', '1.800', '0.0821', '7.000', '0.7077', 1, 1, 1, 1, 1725976408.1191373]
VI_at__the_End : ['1.201', '0.5068', '1.800', '0.1425', '1.800', '0.1111', '7.000', '0.7083', 1, 1, 1, 1, 1725976475.4050348]