TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_54_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-024-12 | FUSED_ID : 6359364768397050252
  IC_TEMP :  -56.26 | VDDM : 1122.98 | AUX_INT :   -8.20 | CsaBias :   65.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38791e-03 / 2
  ADC_P0  : -8.20392e-03 ± 2.52118e-02
  ADC_P1  : 8.29857e-03 ± 6.01977e-04
  ADC_P2  : -6.45549e-06 ± 2.83083e-06
  CSA_Chi2/NDF : 1.01023e-04 / 2
  CSA_P0  : 5.56029e-02 ± 6.70398e-03
  CSA_P1  : 9.30637e-03 ± 5.05097e-04
  CSA_P2  : -3.99744e-05 ± 7.69202e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [37, 49, 64, 73, 77, 93, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 43, 74, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3418', '1.800', '0.1246', '1.800', '0.0897', '7.000', '0.7077', 1, 1, 1, 1, 1725976497.0582712]
VI_after__Init : ['1.202', '0.3416', '1.800', '0.1246', '1.800', '0.0841', '7.000', '0.7076', 1, 1, 1, 1, 1725976505.2807274]
VI_at__the_End : ['1.201', '0.4821', '1.800', '0.1344', '1.800', '0.1125', '7.000', '0.7083', 1, 1, 1, 1, 1725976573.5034173]