TEST_NAME : Wafer
TEST_DATE : 24_09_10-15_59_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-012-027-12 | FUSED_ID : 6359364768397050300
  IC_TEMP :  -58.70 | VDDM : 1118.11 | AUX_INT : -137.36 | CsaBias :  -17.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29000e-03 / 2
  ADC_P0  : -1.37360e-01 ± 3.11020e-02
  ADC_P1  : 1.01285e-02 ± 7.17454e-04
  ADC_P2  : -1.20141e-05 ± 3.24860e-06
  CSA_Chi2/NDF : 1.20840e-04 / 2
  CSA_P0  : 5.77222e-02 ± 7.33209e-03
  CSA_P1  : 9.51474e-03 ± 5.52420e-04
  CSA_P2  : -4.15669e-05 ± 8.41271e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [53, 54, 59, 73, 91, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [18, 33, 36, 62, 75, 97, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3036', '1.800', '0.1508', '1.800', '0.0849', '7.000', '0.7076', 1, 1, 1, 1, 1725976789.0868864]
VI_after__Init : ['1.202', '0.3037', '1.800', '0.1508', '1.800', '0.0793', '7.000', '0.7077', 1, 1, 1, 1, 1725976797.2174175]
VI_at__the_End : ['1.202', '0.4939', '1.800', '0.1356', '1.800', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1725976857.5138268]