TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_30_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-013-008-06 | FUSED_ID : 6359364768397054086
  IC_TEMP :  -52.35 | VDDM : 1129.17 | AUX_INT :  -53.08 | CsaBias :   45.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11924e-03 / 2
  ADC_P0  : -5.30799e-02 ± 2.47668e-02
  ADC_P1  : 9.02642e-03 ± 5.95838e-04
  ADC_P2  : -8.21377e-06 ± 2.81779e-06
  CSA_Chi2/NDF : 1.18181e-04 / 2
  CSA_P0  : 6.09930e-02 ± 7.25097e-03
  CSA_P1  : 9.99295e-03 ± 5.46308e-04
  CSA_P2  : -4.50077e-05 ± 8.31963e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 27, 49, 63, 73, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 16, 29, 39, 53]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1173', '1.800', '0.1527', '1.800', '0.0807', '7.000', '0.7076', 1, 1, 1, 1, 1725978630.4204862]
VI_after__Init : ['1.202', '0.1173', '1.800', '0.1527', '1.800', '0.0750', '7.000', '0.7078', 1, 1, 1, 1, 1725978638.702825]
VI_at__the_End : ['1.202', '0.5081', '1.800', '0.1426', '1.800', '0.1125', '7.000', '0.7080', 1, 1, 1, 1, 1725978706.6074483]