TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_28_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-013-009-06 | FUSED_ID : 6359364768397054102
  IC_TEMP :  -58.09 | VDDM : 1109.17 | AUX_INT :   -8.06 | CsaBias :   89.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21445e-03 / 2
  ADC_P0  : -8.05985e-03 ± 2.36224e-02
  ADC_P1  : 8.21467e-03 ± 5.72322e-04
  ADC_P2  : -5.40257e-06 ± 2.74820e-06
  CSA_Chi2/NDF : 1.27893e-04 / 2
  CSA_P0  : 5.95471e-02 ± 7.54303e-03
  CSA_P1  : 9.77403e-03 ± 5.68313e-04
  CSA_P2  : -4.59693e-05 ± 8.65473e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 23, 49, 66, 73, 90, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [41, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2969', '1.800', '0.1690', '1.800', '0.0940', '7.000', '0.7080', 1, 1, 1, 1, 1725978533.4019966]
VI_after__Init : ['1.202', '0.2970', '1.800', '0.1691', '1.800', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1725978541.531341]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1380', '1.800', '0.1156', '7.000', '0.7084', 1, 1, 1, 1, 1725978609.626033]