TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_24_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-013-012-06 | FUSED_ID : 6359364768397054150
  IC_TEMP :  -53.37 | VDDM : 1128.33 | AUX_INT :   -9.86 | CsaBias :   81.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64747e-03 / 2
  ADC_P0  : -9.85573e-03 ± 2.74846e-02
  ADC_P1  : 8.39477e-03 ± 6.59085e-04
  ADC_P2  : -6.51908e-06 ± 3.13301e-06
  CSA_Chi2/NDF : 1.09495e-04 / 2
  CSA_P0  : 5.93941e-02 ± 6.97941e-03
  CSA_P1  : 9.87774e-03 ± 5.25848e-04
  CSA_P2  : -4.31658e-05 ± 8.00805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [43, 48, 65, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 26, 48, 59, 79, 81, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3260', '1.800', '0.1650', '1.800', '0.0911', '7.000', '0.7080', 1, 1, 1, 1, 1725978242.002742]
VI_after__Init : ['1.202', '0.3261', '1.800', '0.1649', '1.800', '0.0855', '7.000', '0.7082', 1, 1, 1, 1, 1725978250.7689362]
VI_at__the_End : ['1.201', '0.5060', '1.800', '0.1415', '1.800', '0.1111', '7.000', '0.7088', 1, 1, 1, 1, 1725978319.4946308]