TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_19_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-013-015-06 | FUSED_ID : 6359364768397054198
  IC_TEMP :  -52.38 | VDDM : 1131.91 | AUX_INT :   -6.87 | CsaBias :   67.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.73403e-04 / 2
  ADC_P0  : -6.87076e-03 ± 1.99669e-02
  ADC_P1  : 8.32876e-03 ± 4.82119e-04
  ADC_P2  : -6.33423e-06 ± 2.29342e-06
  CSA_Chi2/NDF : 5.61452e-05 / 2
  CSA_P0  : 5.97709e-02 ± 4.99780e-03
  CSA_P1  : 9.19573e-03 ± 3.76548e-04
  CSA_P2  : -3.43143e-05 ± 5.73438e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [76, 78, 112, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [13, 43, 53, 63, 91, 117, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2442', '1.800', '0.1451', '1.800', '0.0893', '7.000', '0.7079', 1, 1, 1, 1, 1725977951.0575166]
VI_after__Init : ['1.202', '0.2442', '1.800', '0.1451', '1.800', '0.0840', '7.000', '0.7080', 1, 1, 1, 1, 1725977959.9747303]
VI_at__the_End : ['1.200', '0.5000', '1.800', '0.1394', '1.800', '0.1107', '7.000', '0.7087', 1, 1, 1, 1, 1725978026.9904635]