TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_15_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-013-017-01 | FUSED_ID : 6359364768397054225
  IC_TEMP :  -51.60 | VDDM : 1130.47 | AUX_INT :   -7.66 | CsaBias :   81.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05723e-03 / 2
  ADC_P0  : -7.66204e-03 ± 2.20010e-02
  ADC_P1  : 8.19823e-03 ± 5.26780e-04
  ADC_P2  : -5.78537e-06 ± 2.49293e-06
  CSA_Chi2/NDF : 9.55192e-05 / 2
  CSA_P0  : 5.89283e-02 ± 6.51880e-03
  CSA_P1  : 9.79821e-03 ± 4.91145e-04
  CSA_P2  : -4.26000e-05 ± 7.47955e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 16, 95, 104, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [11, 29, 31, 41, 45, 47, 68, 71, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1520', '1.800', '0.1414', '1.800', '0.0859', '7.000', '0.7080', 1, 1, 1, 1, 1725977757.686443]
VI_after__Init : ['1.202', '0.1520', '1.800', '0.1413', '1.800', '0.0807', '7.000', '0.7079', 1, 1, 1, 1, 1725977766.005817]
VI_at__the_End : ['1.201', '0.5036', '1.800', '0.1397', '1.800', '0.1105', '7.000', '0.7089', 1, 1, 1, 1, 1725977827.2170348]