TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_40_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-003-08 | FUSED_ID : 6359364768397058104
  IC_TEMP :  -57.08 | VDDM : 1129.12 | AUX_INT :   -6.19 | CsaBias :   71.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.74988e-04 / 2
  ADC_P0  : -6.19155e-03 ± 1.87960e-02
  ADC_P1  : 8.74675e-03 ± 4.78810e-04
  ADC_P2  : -6.96306e-06 ± 2.39775e-06
  CSA_Chi2/NDF : 1.24230e-04 / 2
  CSA_P0  : 5.74543e-02 ± 7.43423e-03
  CSA_P1  : 9.75595e-03 ± 5.60116e-04
  CSA_P2  : -4.40311e-05 ± 8.52990e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [50, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [22, 37, 38, 100, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2822', '1.800', '0.1168', '1.800', '0.0884', '7.000', '0.7069', 1, 1, 1, 1, 1725979212.443402]
VI_after__Init : ['1.201', '0.2823', '1.800', '0.1168', '1.800', '0.0826', '7.000', '0.7069', 1, 1, 1, 1, 1725979220.6187694]
VI_at__the_End : ['1.201', '0.4961', '1.800', '0.1383', '1.800', '0.1125', '7.000', '0.7078', 1, 1, 1, 1, 1725979289.1544943]