TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_43_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-005-08 | FUSED_ID : 6359364768397058136
  IC_TEMP :  -52.89 | VDDM : 1124.57 | AUX_INT :   -9.60 | CsaBias :   81.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69348e-03 / 2
  ADC_P0  : -9.60439e-03 ± 2.79446e-02
  ADC_P1  : 8.33532e-03 ± 6.83873e-04
  ADC_P2  : -5.45837e-06 ± 3.33282e-06
  CSA_Chi2/NDF : 1.11359e-04 / 2
  CSA_P0  : 5.81311e-02 ± 7.03857e-03
  CSA_P1  : 9.90680e-03 ± 5.30305e-04
  CSA_P2  : -4.37755e-05 ± 8.07592e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [15, 17, 25, 28, 46, 64, 80, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [46, 109, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4314', '1.800', '0.1228', '1.800', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1725979405.7124934]
VI_after__Init : ['1.202', '0.4316', '1.800', '0.1229', '1.800', '0.0861', '7.000', '0.7069', 1, 1, 1, 1, 1725979413.9308958]
VI_at__the_End : ['1.201', '0.5048', '1.800', '0.1401', '1.800', '0.1113', '7.000', '0.7078', 1, 1, 1, 1, 1725979482.4366095]