TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_48_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-008-08 | FUSED_ID : 6359364768397058184
  IC_TEMP :  -51.03 | VDDM : 1129.25 | AUX_INT :   -8.19 | CsaBias :   87.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20257e-03 / 2
  ADC_P0  : -8.19468e-03 ± 2.34984e-02
  ADC_P1  : 8.07475e-03 ± 5.57975e-04
  ADC_P2  : -5.28577e-06 ± 2.62704e-06
  CSA_Chi2/NDF : 8.62874e-05 / 2
  CSA_P0  : 5.85652e-02 ± 6.19578e-03
  CSA_P1  : 9.56117e-03 ± 4.66807e-04
  CSA_P2  : -3.98719e-05 ± 7.10893e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [31, 39, 41, 67, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [23, 36, 37, 55, 64, 97, 100, 114, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3397', '1.800', '0.1236', '1.800', '0.0873', '7.000', '0.7073', 1, 1, 1, 1, 1725979697.8359432]
VI_after__Init : ['1.202', '0.3397', '1.800', '0.1235', '1.800', '0.0816', '7.000', '0.7072', 1, 1, 1, 1, 1725979705.9083414]
VI_at__the_End : ['1.201', '0.4995', '1.800', '0.1384', '1.800', '0.1104', '7.000', '0.7079', 1, 1, 1, 1, 1725979772.386041]