TEST_NAME : Wafer
TEST_DATE : 24_09_10-16_51_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-010-08 | FUSED_ID : 6359364768397058216
  IC_TEMP :  -51.03 | VDDM : 1130.64 | AUX_INT :   -7.29 | CsaBias :   90.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11523e-03 / 2
  ADC_P0  : -7.29059e-03 ± 2.26537e-02
  ADC_P1  : 8.17432e-03 ± 5.51773e-04
  ADC_P2  : -5.09859e-06 ± 2.66166e-06
  CSA_Chi2/NDF : 9.77264e-05 / 2
  CSA_P0  : 5.80219e-02 ± 6.59369e-03
  CSA_P1  : 9.61149e-03 ± 4.96787e-04
  CSA_P2  : -4.07568e-05 ± 7.56548e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 25, 30, 74, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 53, 57, 74, 85, 91, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3266', '1.800', '0.1590', '1.800', '0.0909', '7.000', '0.7072', 1, 1, 1, 1, 1725979890.8250055]
VI_after__Init : ['1.201', '0.3267', '1.800', '0.1590', '1.800', '0.0852', '7.000', '0.7072', 1, 1, 1, 1, 1725979898.8364108]
VI_at__the_End : ['1.201', '0.4975', '1.800', '0.1393', '1.800', '0.1120', '7.000', '0.7080', 1, 1, 1, 1, 1725979958.5987513]