TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_01_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-016-15 | FUSED_ID : 6359364768397058319
  IC_TEMP :  -52.76 | VDDM : 1130.99 | AUX_INT :   -6.61 | CsaBias :   82.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.95725e-04 / 2
  ADC_P0  : -6.60972e-03 ± 1.90728e-02
  ADC_P1  : 8.12886e-03 ± 4.55154e-04
  ADC_P2  : -5.62421e-06 ± 2.14432e-06
  CSA_Chi2/NDF : 1.04604e-04 / 2
  CSA_P0  : 5.97158e-02 ± 6.82176e-03
  CSA_P1  : 9.76339e-03 ± 5.13970e-04
  CSA_P2  : -4.27590e-05 ± 7.82716e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 17, 50, 51, 75, 78, 81, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 12, 24, 47, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3875', '1.800', '0.1644', '1.800', '0.0911', '7.000', '0.7076', 1, 1, 1, 1, 1725980472.684817]
VI_after__Init : ['1.202', '0.3869', '1.800', '0.1642', '1.800', '0.0855', '7.000', '0.7076', 1, 1, 1, 1, 1725980480.8772216]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1396', '1.803', '0.1109', '7.000', '0.7086', 1, 1, 1, 1, 1725980549.3642159]