TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_02_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-017-15 | FUSED_ID : 6359364768397058335
  IC_TEMP :  -52.57 | VDDM : 1138.48 | AUX_INT :  -52.24 | CsaBias :   42.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21303e-03 / 2
  ADC_P0  : -5.22443e-02 ± 2.57607e-02
  ADC_P1  : 8.71151e-03 ± 6.04480e-04
  ADC_P2  : -7.18017e-06 ± 2.80431e-06
  CSA_Chi2/NDF : 1.06281e-04 / 2
  CSA_P0  : 6.03617e-02 ± 6.87622e-03
  CSA_P1  : 9.83040e-03 ± 5.18073e-04
  CSA_P2  : -4.22668e-05 ± 7.88964e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [30, 43, 68, 105, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 30, 51, 52, 53, 118, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3600', '1.800', '0.1478', '1.800', '0.0878', '6.999', '0.7076', 1, 1, 1, 1, 1725980568.6718051]
VI_after__Init : ['1.202', '0.3599', '1.800', '0.1476', '1.800', '0.0821', '7.002', '0.7076', 1, 1, 1, 1, 1725980576.6613193]
VI_at__the_End : ['1.202', '0.5083', '1.800', '0.1394', '1.800', '0.1107', '7.000', '0.7085', 1, 1, 1, 1, 1725980644.7803512]