TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_04_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-018-15 | FUSED_ID : 6359364768397058351
  IC_TEMP :  -50.84 | VDDM : 1130.45 | AUX_INT :   -7.50 | CsaBias :   81.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16556e-03 / 2
  ADC_P0  : -7.49782e-03 ± 2.31592e-02
  ADC_P1  : 8.16832e-03 ± 5.64087e-04
  ADC_P2  : -5.05894e-06 ± 2.72106e-06
  CSA_Chi2/NDF : 9.96545e-05 / 2
  CSA_P0  : 5.95807e-02 ± 6.65841e-03
  CSA_P1  : 1.00442e-02 ± 5.01664e-04
  CSA_P2  : -4.53896e-05 ± 7.63974e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [24, 27, 40, 54, 59, 66, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [20, 24, 36, 65, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4221', '1.800', '0.1676', '1.800', '0.0983', '7.000', '0.7084', 1, 1, 1, 1, 1725980665.5249128]
VI_after__Init : ['1.202', '0.4220', '1.800', '0.1676', '1.799', '0.0912', '7.000', '0.7078', 1, 1, 1, 1, 1725980673.7082264]
VI_at__the_End : ['1.202', '0.5087', '1.800', '0.1413', '1.799', '0.1118', '6.999', '0.7087', 1, 1, 1, 1, 1725980740.9411318]