TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_12_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-014-023-15 | FUSED_ID : 6359364768397058431
  IC_TEMP :  -51.05 | VDDM : 1128.87 | AUX_INT :   -8.06 | CsaBias :   89.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21445e-03 / 2
  ADC_P0  : -8.05985e-03 ± 2.36224e-02
  ADC_P1  : 8.21467e-03 ± 5.72322e-04
  ADC_P2  : -5.40257e-06 ± 2.74820e-06
  CSA_Chi2/NDF : 9.93242e-05 / 2
  CSA_P0  : 5.95151e-02 ± 6.64737e-03
  CSA_P1  : 9.90279e-03 ± 5.00831e-04
  CSA_P2  : -4.21711e-05 ± 7.62707e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [20, 32, 33, 46, 51, 58, 88, 91, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [15, 23, 44, 48, 81, 95, 98, 121, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5357', '1.800', '0.1443', '1.800', '0.1016', '7.000', '0.7090', 1, 1, 1, 1, 1725981149.4198992]
VI_after__Init : ['1.202', '0.5361', '1.800', '0.1443', '1.800', '0.0947', '7.000', '0.7077', 1, 1, 1, 1, 1725981157.6211953]
VI_at__the_End : ['1.201', '0.5097', '1.800', '0.1396', '1.804', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1725981224.6873572]