TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_39_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-015-012-05 | FUSED_ID : 6359364768397062341
  IC_TEMP :  -51.82 | VDDM : 1108.96 | AUX_INT :   -9.64 | CsaBias :   79.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46948e-03 / 2
  ADC_P0  : -9.64285e-03 ± 2.59912e-02
  ADC_P1  : 8.17392e-03 ± 6.19852e-04
  ADC_P2  : -5.35981e-06 ± 2.95015e-06
  CSA_Chi2/NDF : 1.12546e-04 / 2
  CSA_P0  : 6.05920e-02 ± 7.07600e-03
  CSA_P1  : 1.00968e-02 ± 5.33126e-04
  CSA_P2  : -4.65717e-05 ± 8.11887e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [21, 45, 55, 66, 84, 107, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [32, 70, 77, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1808', '1.800', '0.1600', '1.800', '0.0875', '7.000', '0.7082', 1, 1, 1, 1, 1725982797.5717428]
VI_after__Init : ['1.202', '0.1809', '1.800', '0.1599', '1.800', '0.0801', '7.000', '0.7074', 1, 1, 1, 1, 1725982806.275107]
VI_at__the_End : ['1.202', '0.5064', '1.800', '0.1405', '1.800', '0.1115', '7.000', '0.7079', 1, 1, 1, 1, 1725982872.4290137]