TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_38_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-015-013-05 | FUSED_ID : 6359364768397062357
  IC_TEMP :  -51.58 | VDDM : 1132.17 | AUX_INT :   -6.90 | CsaBias :   90.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.64831e-04 / 2
  ADC_P0  : -6.90112e-03 ± 2.10333e-02
  ADC_P1  : 8.15965e-03 ± 5.06261e-04
  ADC_P2  : -5.49943e-06 ± 2.40667e-06
  CSA_Chi2/NDF : 1.20630e-04 / 2
  CSA_P0  : 5.80420e-02 ± 7.32572e-03
  CSA_P1  : 1.00817e-02 ± 5.51940e-04
  CSA_P2  : -4.68420e-05 ± 8.40539e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [6, 13, 17, 18, 26, 55, 73, 74, 87, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 13, 41, 58, 111, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3248', '1.800', '0.1587', '1.799', '0.0961', '7.000', '0.7077', 1, 1, 1, 1, 1725982700.7581253]
VI_after__Init : ['1.202', '0.3250', '1.800', '0.1588', '1.800', '0.0910', '7.000', '0.7073', 1, 1, 1, 1, 1725982708.7944136]
VI_at__the_End : ['1.202', '0.5054', '1.800', '0.1369', '1.800', '0.1102', '7.000', '0.7080', 1, 1, 1, 1, 1725982771.7406394]