TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_35_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-015-015-05 | FUSED_ID : 6359364768397062389
  IC_TEMP :  -50.08 | VDDM : 1130.43 | AUX_INT :   -5.64 | CsaBias :   68.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.55560e-04 / 2
  ADC_P0  : -5.64152e-03 ± 1.73093e-02
  ADC_P1  : 8.33286e-03 ± 4.28835e-04
  ADC_P2  : -5.64921e-06 ± 2.09261e-06
  CSA_Chi2/NDF : 7.59491e-05 / 2
  CSA_P0  : 6.15340e-02 ± 5.81278e-03
  CSA_P1  : 9.26832e-03 ± 4.37951e-04
  CSA_P2  : -3.55002e-05 ± 6.66947e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 57, 99, 101, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 13, 16, 39, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2620', '1.800', '0.1898', '1.799', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1725982506.6225903]
VI_after__Init : ['1.202', '0.2621', '1.800', '0.1898', '1.800', '0.0802', '7.000', '0.7076', 1, 1, 1, 1, 1725982514.6670825]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1405', '1.800', '0.1111', '7.000', '0.7083', 1, 1, 1, 1, 1725982582.9198046]