TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_33_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-015-016-02 | FUSED_ID : 6359364768397062402
  IC_TEMP :  -51.46 | VDDM : 1127.97 | AUX_INT :   -8.54 | CsaBias :   80.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21705e-03 / 2
  ADC_P0  : -8.54158e-03 ± 2.36223e-02
  ADC_P1  : 8.12491e-03 ± 5.57998e-04
  ADC_P2  : -5.64326e-06 ± 2.61534e-06
  CSA_Chi2/NDF : 7.92355e-05 / 2
  CSA_P0  : 5.97669e-02 ± 5.93721e-03
  CSA_P1  : 9.79942e-03 ± 4.47326e-04
  CSA_P2  : -4.18697e-05 ± 6.81224e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [32, 38, 82, 88, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [39, 56, 57, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4994', '1.800', '0.1499', '1.800', '0.0912', '7.000', '0.7078', 1, 1, 1, 1, 1725982409.9350047]
VI_after__Init : ['1.202', '0.4997', '1.800', '0.1500', '1.800', '0.0855', '7.000', '0.7079', 1, 1, 1, 1, 1725982418.0493863]
VI_at__the_End : ['1.201', '0.5048', '1.800', '0.1368', '1.800', '0.1100', '7.000', '0.7084', 1, 1, 1, 1, 1725982484.2213342]